A Comparison of Two Delay Line Discriminator Implementations for Low Cost Phase Noise Measurement
نویسنده
چکیده
This paper focuses on low cost production testing of the far-out phase noise of PLL ICs using the delay line discriminator method. It describes two different delay line discriminator (DLD) implementations for phase noise measurements at large frequency offsets from the carrier. The calibration method using an FM calibration signal is described in detail, both mathematically and graphically. The results show good comparison with laboratory based phase noise measurement equipment.
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